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Tria SNOM

Tria SNOM

La technique de microscopie optique à champ proche (également appelée SNOM ou NSOM) est membre de
la famille des microscopie à sonde local, permettant la détection des propriétés optiques aux résolutions inférieue à la limite de diffraction.
Le système TriA SNOM est un SNOM scientifique universel puissant et bien conçu pour caractériser tout type d'échantillon de surface, des échantillons biologiques et non biologiques. Basé sur la technologie de la sonde de balayage, une petite sonde optique est très proche de la surface de l'échantillon, dans la région appelée «champ proche», et permet la collecte de signaux optiques offrant une résolution d'image inférieure à 100 nm.

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Caractéristiques produits

 

SCANNING SYSTEM
Scanning stage with absolute positioning system and strain gauge sensors.
XY scan size Z scan size
• 100μm x 100μm (high voltage mode) • 10μm x 10μm (low voltage mode) • 10μm (high voltage mode) • 1μm (low voltage mode)
Resolution (high voltage mode) Resolution
• 2nm (closed loop) • 0.2nm (open loop) • 0.16nm (high voltage mode)

• 0.02nm (low voltage mode)

Closed loop linearity 0,1%
Maximum sample size: can accommodate samples with different geometries and sizes up to 30mm diameter.

 

WORKING MODES

SNOM Topography: The image obtained is the result of signals acquisition in xyz axis that allows to measure detailed surface morphology and nanostructures on a nanometric scale. SNOM Optical Transmission: the image results from the light transmitted through the whole thickness of the sample. While in conventional optical microscope all the sample is illuminated, SNOM near-field light interacts only locally producing signals point by point. SNOM optical transmission images are comparable with conventional optical images but their lateral resolution is more than 10 times higher.
SNOM Optical Reflection: image is obtained with nearfield light that interacts locally with a superficial layer of the sample, giving information on structures confined within 30-100 nm (depending on the tip aperture) below sample surface. SNOM Optical Back-Reflection: image is created by the near-field light that is back-reflected into the fiber, after local interaction with the sample surface.

 

SPM CONTROL SYSTEM
• Composed by a digitally controlled analog feedback that combines the flexibility of computer controlled parameters with the high resolution and low noise of an analogue implementation. This detection scheme provides sub-nanometric vertical resolution in the images and all collected signals are distortions free. Electronics supports STM, AFM and SNOM heads, performs different kinds of spectroscopy and can acquire several user-defined auxiliary channels.