10 rue de la Mission Ecole Valentin 25480, France
+ 33 (0)3 81 53 26 25
info@lovalite.com
A100 AFM

A100 AFM

Avec plus de 15 ans d'expérience A.P.E. Research a développé plusieurs systèmes avancés de microscopie à sonde local afin de fournir les outils de recherche pour les universités et les centres de recherche actifs dans le domaine des nanotechnologies.
L'A100 AFM est un microscope à force atomique haute résolution polyvalent adapté à un une grande variété d'applications, y compris la mesure de surface, la technologie des semi-conducteurs, la chimie et les polymères, l'optoélectronique, la bioscience et la médecine.

Télécharger la fiche produit

Caractéristiques produits

KEY FEATURES

• Integrated acoustic and vibration
damping system

• Ease of Use

• Easily interchangeable samples

• Automatic tip / sample approach

• High Versatility

• A100 support major SPM techniques but not restricted to the following:

• Contact • Non-contact • Semi-contact

• Force modulation • Lateral force • Force curves analysis

• Electric properties • Phase imagine • STM

• Magnetic force microscopy

 

SCANNING SYSTEM
Scanning stage with absolute positioning system and strain gauge sensors.
XY Scan size Z scan size

• 100μm x 100μm
(high voltage mode)

• 10μm x 10μm
(low voltage mode)

• 10μm
(high voltage mode)

• 1μm
(low voltage mode)

Resolution (high voltage mode) Resolution:

• 2nm
(closed loop)

• 0.2nm
(open loop)

• 0.16nm
(high voltage mode)

• 0.02nm
(low voltage mode)

 
Closed loop linearity 0,1%

AFM Head with holder for commercial cantilevers. The holder can be removed to easy mount cantilevers. The head also houses laser, photodiode sensor with preamplifier.

SPM Control Unit and PC (equipped with a multi inputoutput board) drives the scanner, data acquisition and sample motion. Tip to sample distance is controlled by ultra-low noise analog feedback, digitally driven by PC. High speed and temporal precision are provided by hardware timing.

Software runs under Windows and is composed of a multi-window applications for instrument control and data acquisition. The software comes equipped with simple filters for immediate analysis of acquired images. The software controls all the parameters of the instrument.

• A.P.E. Research have developed additional AFM tools for specific measurement modes (EFM, MFM, STM, Phase Imaging, CAFM, KPM, Nanolithography, etc.)

• The system can be equipped of various kind ofscanners for different working ranges.